PATHAK, K. R. .; HANEEF, F. . EEG based Stress Analysis through Feature Extraction. International Journal on Recent and Innovation Trends in Computing and Communication, [S. l.], v. 11, n. 8, p. 140–144, 2023. DOI: 10.17762/ijritcc.v11i8.7931. Disponível em: https://mail.ijritcc.org/index.php/ijritcc/article/view/7931. Acesso em: 13 sep. 2025.