REENU JACOB, et al. Characterization of Bismuth Titanate by Line Profile Analysis. International Journal on Recent and Innovation Trends in Computing and Communication, [S. l.], v. 11, n. 8, p. 424–430, 2023. DOI: 10.17762/ijritcc.v11i8.9385. Disponível em: https://mail.ijritcc.org/index.php/ijritcc/article/view/9385. Acesso em: 12 sep. 2025.